Characterisation of solid supported nanostructured thin films by scanning angle reflectometry and UV-Vis spectrometry

Materials Science Forum

Volumn 537-538, Issue , 2007, Pages 329-336

  Deák, András ^a   Hild, Erzsébet ^a   Kovács, Attila L ^b   Hórvölgyi, Zoltán ^a  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^b EÖTVÖS LORÁND UNIVERSITY   (Hungary)

Author keywords

Langmuir Blodgett films; Scanning angle reflectometry; St ber silica; UV Vis spectroscopy

Indexed keywords

CHARACTERIZATION; NANOSTRUCTURED MATERIALS; OPACITY; REFLECTOMETERS; SILICA; THIN FILMS; ULTRAVIOLET VISIBLE SPECTROSCOPY; VOLUME FRACTION;

SCANNING ANGLE REFLECTOMETRY; THIN LAYER OPTICS;

LANGMUIR BLODGETT FILMS;

EID: 38449094255     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-426-x.329     Document Type: Conference Paper

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