Characterisation of silica nanoparticulate layers with scanning-angle reflectometry

Progress in Colloid and Polymer Science

Volumn 125, Issue , 2004, Pages 61-67

  Hild, Erzsébet ^a   Seszták, Tímea ^a   Völgyes, Dávid ^a   Hórvölgyi, Zoltán ^a  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

Author keywords

Layer of silica nanoparticles; Reflectance of inhomogeneous layers; Scanning angle reflectometry; St ber silica

Indexed keywords

SILICON DIOXIDE;

ARTICLE; CHEMICAL ANALYSIS; HYDROPHILICITY; HYDROPHOBICITY; LASER; LIQUID; MATHEMATICAL ANALYSIS; NANOPARTICLE; PARTICLE SIZE; REFLECTOMETRY; REFRACTION INDEX; SURFACE PROPERTY; THICKNESS;

EID: 8644243692     PISSN: 0340255X     EISSN: None     Source Type: Book Series    
DOI: 10.1007/b13920     Document Type: Article

References (11)

1. Schaaf P, Déjardin P, Schmitt A (1987) Langmuir 3:1131
2. Mann EK, van der Zeeuw EA, Koper GJM, Schaaf P, Bedeaux D (1995) J Phys Chem 99:790
3. van der Zeeuw EA, Sagis LM, Koper GJM, Mann EK, Haarmans MT, Bedeaux D (1996) J Chem Phys 105:1646
4. Mann EK, Heinrich L, Voegel JC, Schaaf P (1996) J Chem Phys 105:6082
5. van Blaadaren A, Vrij A (1992) Langmuir 8:2921
6. Boyd RV, Gehr RJ, Fischer GL, Sipe JE (1996) Pure Appl Opt 5:505
7. Jacobsson R (1965) In: Wolf E (ed) Progress in optics, vol 5. North Holland, Amsterdam, pp 247-286
8. Hild E, Evans MW (1986) J Appl Phys 59:1822
9. Stöber A, Fink E, Bohm J (1968) Colloid Interface Sci 26:63
10. Tolnai G, Csempesz F, Kabai-Faix M, Kálmán E, Keresztes Z, Kovács AL, Ramsden JJ, Hórvölgyi Z (2001) Langmuir 17:2683
11. Seszták T (2001) Fabrication and investigation of nanostructural layers (in Hungarian). Thesis. Budapest University of Technology and Economics