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Volumn , Issue , 2004, Pages 543-547

Microstructural behaviour of solder alloys

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIBILITY OF SOLIDS; COMPUTER SIMULATION; CRACK INITIATION; DEFORMATION; ELASTICITY; FREE ENERGY; MACHINE DESIGN; MATHEMATICAL MODELS; METALLOGRAPHIC MICROSTRUCTURE; RANDOM PROCESSES; SOLIDIFICATION; SURFACE TENSION; THERMAL CYCLING;

EID: 3843076298     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (15)
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  • 2
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    • Basaran, C., Desai, C. and Kundu, T. [1998b], 'Thermomechanical finite element analysis of problems in electronic packaging using the disturbed state concept. Part II: Verification and application', Journal of Electronic Packaging 120(1), 48-54.
    • (1998) Journal of Electronic Packaging , vol.120 , Issue.1 , pp. 48-54
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  • 6
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    • (1988) Journal of Electronic Materials , vol.17 , pp. 171-180
    • Frear, D.1    Grivas, D.2    Morris Jr., J.3
  • 7
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    • Phase segregation dynamics in particle systems with long range interactions. I. Macroscopic limits
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  • 8
    • 0031185951 scopus 로고    scopus 로고
    • Microstructure coarsening during thermo-mechanical fatigue of Pb-Sn solder joints
    • Hacke, P., Sprecher, A. and Conrad, H. [1998], 'Microstructure coarsening during thermo-mechanical fatigue of Pb-Sn solder joints', Journal of Electronic Materials 26(7), 774-782.
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  • 9
    • 0028737676 scopus 로고
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    • S. Schroeder and M. Mitchell, eds, American Society for Testing and Materials, Philadelphia
    • Ju, S., Kuskowski, S., Sandor, B. and Plesha, M. [1994], Creep-fatigue damage analysis of solder joints, in S. Schroeder and M. Mitchell, eds, 'Fatigue of electronic materials, STP-1153', American Society for Testing and Materials, Philadelphia, pp. 1-21.
    • (1994) Fatigue of Electronic Materials, STP-1153 , pp. 1-21
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  • 10
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    • Kanchanomai, C., Miyashita, Y. and Mutoh, Y. [2002], 'Low cycle fatigue behavior and mechanisms of a eutectic Sn-Pb solder 63sn/37pb', International Journal of fatigue 24, 671-683.
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  • 11
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    • (2003) Thermal and Mechanical Simulation and Experiments in Micro-electronics and Micro-systems , pp. 111-116
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  • 14
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  • 15
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    • Zhao, J., Miyashita, Y. and Mutoh, Y. [2001], 'Fatigue crack growth behavior of 96.5Sn-3.5Ag lead-free solder', International Journal of Fatigue 23, 723-731.
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    • Zhao, J.1    Miyashita, Y.2    Mutoh, Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.