SCOPUS 정보 검색 플랫폼

Volumn 558-559, Issue PART 2, 2007, Pages 915-920

Three-dimensional microstructure reconstruction using FIB-OIM

(3) Lee, S B a Rollett, A D a Rohrer, G S a

a CARNEGIE MELLON UNIVERSITY (United States)

Author keywords

Disorientation; Electron Back Scatter Diffraction (EBSD); Focused Ion Beam Orientation Imaging Microscopy (FIB OIM); Normalized grain size distribution; Serial sectioning

Indexed keywords

ELECTRON DIFFRACTION; FOCUSED ION BEAMS; GRAIN SIZE AND SHAPE; MICROSCOPIC EXAMINATION; SIZE DISTRIBUTION;

DISORIENTATION; ELECTRON BACK SCATTER DIFFRACTION (EBSD); NORMALIZED GRAIN SIZE DISTRIBUTION; ORIENTATION IMAGING MICROSCOPY (OIM);

MICROSTRUCTURE;

EID: 38349179774 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/0-87849-443-x.915 Document Type: Conference Paper

Times cited : (25)

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