The sensitivity of focusing, parallel beam and mixed optics to alignment errors in XRD residual stress measurements

Materials Science Forum

Volumn 490-491, Issue , 2005, Pages 131-136

  Vermeulen, Arnold C ^a  

^a MALVERN INSTRUMENTS LTD   (United Kingdom)

Author keywords

Alignment errors; Focusing optics; Parallel beam; Residual stress; XRD

Indexed keywords

ALIGNMENT; BEAM QUALITY; DIFFRACTIVE OPTICS; ERROR ANALYSIS; FOCUSING; X RAY DIFFRACTION ANALYSIS;

DIFFRACTED BEAM OPTICS MODULES; FOCUSING BEAM GEOMETRY; FOCUSING BEAM OPTICS; MIXED OPTICS; PARALLEL BEAM GEOMETRY;

RESIDUAL STRESSES;

EID: 33645234413     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-969-5.131     Document Type: Conference Paper

References (4)

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2. A.C. Vermeulen: Proc. ICRS-6 conf., 10-12 July 2000, Oxford, UK, pp. 283-290
3. T. Hanabusa: Proc. ICRS-6 conf., 10-12 July 2000, Oxford, UK, pp. 181-188
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