Structural characterization using the multiple scattering effects in grazing-incidence small-angle X-ray scattering

Journal of Applied Crystallography

Volumn 41, Issue 1, 2008, Pages 134-142

  Lee, Byeongdu ^a   Lo, Chieh Tsung ^a   Thiyagarajan, P ^a   Lee, Dong R ^b   Niu, Zhongwei ^c   Wang, Qian ^c  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b POSTECH   (South Korea)

^c UNIVERSITY OF SOUTH CAROLINA   (United States)

Author keywords

Grazing incidence small angle scattering; Kiessig fringe; Multiple scattering; Thin film; Viron; Virus

Indexed keywords

EID: 38349110891     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889807051345     Document Type: Article

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