Morphological characterization of ion-sputtered C-Ag, C/C-Ag and Ag/C films by GISAXS

Journal of Applied Crystallography

Volumn 32, Issue 2, 1999, Pages 226-233

  Babonneau, D ^a   Naudon, A ^a   Thiaudiere D ^b   Lequien, S ^b  

^a UNIVERSITÉ DE POITIERS   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000020660     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889898011996     Document Type: Article

References (6)

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3. Cabioc'h, T., Naudon, A., Jaouen, M., Thiaudière, D. & Babonneau, D. (1998). In the press..
4. Chai, Y., Guo, T., Jin, C. H., Haufler, R. E., Chibante, L. P. F., Fure, J., Wang, L. H., Alford, J. M. & Smalley, R. E. (1991). J. Phys. Chem. 95, 7564-7568.
5. Guerret-Piécourt, C., Le Bouar, Y., Loiseau, A. & Pascard, H. (1994). Nature (London), 372, 761-765.
6. Guinier, A. & Fournet, G. (1955). Small-Angle Scattering of X-rays. New York: John Wiley.