Critical role of inelastic interactions in quantitative electron microscopy

Physical Review Letters

Volumn 100, Issue 2, 2008, Pages

  Mkhoyan, K A ^a   MacCagnano Zacher, S E ^a   Thomas, M G ^a   Silcox, J ^a  

^a Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; ELECTRON DIFFRACTION; INELASTIC SCATTERING; MEASUREMENT THEORY;

BEAM PROPAGATION; PLASMON SCATTERING;

ELECTRON MICROSCOPY;

EID: 38349110876     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.100.025503     Document Type: Article

References (16)

1. M.J. Hytch and W.M. Stobbs, Ultramicroscopy 53, 191 (1994). ULTRD6 0304-3991 10.1016/0304-3991(94)90034-5
2. C.B. Boothroyd, J. Microsc. 190, 99 (1998). JMICAR 0022-2720 10.1046/j.1365-2818.1998.2910843.x
3. C.B. Boothroyd, R.E. Dunin-Borkowski, W.M. Stobbs, and C.J. Humphreys, Mater. Res. Soc. Symp. Proc. MRSPDH 0272-9172 354, 495 (1995).
4. C.B. Boothroyd and M. Yeadon, Ultramicroscopy 96, 361 (2003). ULTRD6 0304-3991 10.1016/S0304-3991(03)00101-3
5. A. Howie, Ultramicroscopy 98, 73 (2004). ULTRD6 0304-3991 10.1016/j.ultramic.2003.08.002
6. H. Lichte, Phil. Trans. R. Soc. A PTRMAD 1364-503X 360, 897 (2002). 10.1098/rsta.2001.0973
7. R.A. Herring, Ultramicroscopy 106, 960 (2006). ULTRD6 0304-3991 10.1016/j.ultramic.2006.04.001
8. For example, in a recent paper [J.M. Zuo, Science 300, 1419 (2003)] the central beam of the electron beam was "obtained from the amplitude of the Fourier transform of a low resolution image." SCIEAS 0036-8075 10.1126/science.1083887
9. J.C.H. Spence and J.M. Zuo, Electron Microdiffraction (Plenum, New York, 1992).
10. R. Egerton, Electron Energy Loss Spectroscopy in the Electron Microscope (Plenum, New York, 1996).
11. R.F. Loane, P. Xu, and J. Silcox, Acta Crystallogr. Sect. A ACACEQ 0108-7673 47, 267 (1991). 10.1107/S0108767391000375
12. E.J. Kirkland, Advanced Computing in Electron Microscopy (Plenum, New York, 1998).
13. P. Hirsch, A. Howie, R. Nicholson, D.W. Pashley, and M.J. Whelan, Electron Microscopy of Thin Crystals (Krieger, Malabar, 1977).
14. R.H. Ritchie and A. Howie, Philos. Mag. PHMAA4 0031-8086 36, 463 (1977). 10.1080/14786437708244948
15. K.A. Mkhoyan, T. Babinec, S.E. Maccagnano, E.J. Kirkland, and J. Silcox, Ultramicroscopy 107, 345 (2007). ULTRD6 0304-3991 10.1016/j.ultramic.2006.09.003
16. H. Raether, in Excitation of Plasmons and Interband Transitions by Electrons, Springer Tracts in Modern Physics Vol. 88, edited by, G. Höhler, (Springer-Verlag, Berlin, 1980).