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Volumn 35, Issue 11-12, 2008, Pages 1206-1218

Studies of chipping mechanisms for dicing silicon wafers

Author keywords

Chipping; Dicing; Scratching; Silicon wafer; Slip directions and planes

Indexed keywords

CHIP SCALE PACKAGES; CRACKS; PLASTIC DEFORMATION; PRODUCTION ENGINEERING; SEMICONDUCTING DIAMONDS;

EID: 38149078763     PISSN: 02683768     EISSN: 14333015     Source Type: Journal    
DOI: 10.1007/s00170-006-0800-3     Document Type: Article
Times cited : (63)

References (19)
  • 2
    • 0041910862 scopus 로고    scopus 로고
    • Blade wear and wafer chipping in dicing processes
    • Taiwan
    • Miwa T, Inasaki I (1997) Blade wear and wafer chipping in dicing processes. In: Proceedings of Int Conf Precis Eng, Taiwan, 397-402
    • (1997) Proceedings of Int Conf Precis Eng , pp. 397-402
    • Miwa, T.1    Inasaki, I.2
  • 3
    • 0029257027 scopus 로고
    • Damage processes in ceramics resulting from diamond tool indentation and scratching in various environments
    • Ruff AW, Shin H, Evans CJ (1995) Damage processes in ceramics resulting from diamond tool indentation and scratching in various environments. Wear 181-183:551-562
    • (1995) Wear , vol.181-183 , pp. 551-562
    • Ruff, A.W.1    Shin, H.2    Evans, C.J.3
  • 4
    • 0032305772 scopus 로고    scopus 로고
    • Effect of ultraprecision grinding on the microstructural change in silicon monocrystals
    • Zarudi I, Zhang LC (1998) Effect of ultraprecision grinding on the microstructural change in silicon monocrystals. J Mater Proc Technol 84:149-158
    • (1998) J Mater Proc Technol , vol.84 , pp. 149-158
    • Zarudi, I.1    Zhang, L.C.2
  • 5
    • 33644776063 scopus 로고
    • Improvement of straightness in precision cut-off grinding using thin diamond wheels
    • 1
    • Yamasaka M, Fujisawa M, Oku T, Masuda M (1990) Improvement of straightness in precision cut-off grinding using thin diamond wheels. Ann CIRP 39(1):333-336
    • (1990) Ann CIRP , vol.39 , pp. 333-336
    • Yamasaka, M.1    Fujisawa, M.2    Oku, T.3    Masuda, M.4
  • 7
    • 38149079345 scopus 로고
    • Material-removal mechanisms in grinding ceramics
    • 2
    • Zhang B, Howes TD (1990) Material-removal mechanisms in grinding ceramics. Ann CIRP 39(2):621-635
    • (1990) Ann CIRP , vol.39 , pp. 621-635
    • Zhang, B.1    Howes, T.D.2
  • 8
    • 58149372497 scopus 로고
    • Grinding of hard and brittle materials
    • 2
    • Inasaki I (1987) Grinding of hard and brittle materials. Ann CIRP 36(2):463-471
    • (1987) Ann CIRP , vol.36 , pp. 463-471
    • Inasaki, I.1
  • 10
    • 0031272239 scopus 로고    scopus 로고
    • Mechanisms of material removal in the precision production grinding of ceramics
    • Subramanian K, Ramanath S, Tricard M (1997) Mechanisms of material removal in the precision production grinding of ceramics. T ASME, J Manuf Sci Eng 119:509-519
    • (1997) T ASME, J Manuf Sci Eng , vol.119 , pp. 509-519
    • Subramanian, K.1    Ramanath, S.2    Tricard, M.3
  • 11
    • 0024663224 scopus 로고
    • Grinding mechanisms and strength degradation for ceramics
    • Malkin S, Ritter JE (1989) Grinding mechanisms and strength degradation for ceramics. T ASME, J Eng Ind 111:167-174
    • (1989) T ASME, J Eng Ind , vol.111 , pp. 167-174
    • Malkin, S.1    Ritter, J.E.2
  • 12
    • 0016648164 scopus 로고
    • Review, indentation fracture: Principles and applications
    • Lawn B, Wilshaw R (1975) Review, indentation fracture: principles and applications. J Mater Sci 10:2016-2024
    • (1975) J Mater Sci , vol.10 , pp. 2016-2024
    • Lawn, B.1    Wilshaw, R.2
  • 13
    • 0016427812 scopus 로고
    • Microfracture beneath point indentation in brittle solids
    • Lawn B, Swain MV (1975) Microfracture beneath point indentation in brittle solids. J Mater Sci 10:113-122
    • (1975) J Mater Sci , vol.10 , pp. 113-122
    • Lawn, B.1    Swain, M.V.2
  • 14
    • 30344479190 scopus 로고    scopus 로고
    • Theoretical analysis on the effects of crystal anisotropy on wiresawing process and application to wafer slicing
    • Bhagavat S, Kao I (2006) Theoretical analysis on the effects of crystal anisotropy on wiresawing process and application to wafer slicing. Int J Mach Tool Manufact 46:531-541
    • (2006) Int J Mach Tool Manufact , vol.46 , pp. 531-541
    • Bhagavat, S.1    Kao, I.2
  • 15
    • 0042623430 scopus 로고    scopus 로고
    • Crystallographic cracking behavior in silicon single crystal wafer
    • Tan J, Li SX, Wan Y, Li F, Lu K (2003) Crystallographic cracking behavior in silicon single crystal wafer. Mater Sci Eng B103:49-56
    • (2003) Mater Sci Eng , vol.103 , pp. 49-56
    • Tan, J.1    Li, S.X.2    Wan, Y.3    Li, F.4    Lu, K.5
  • 19
    • 85040875608 scopus 로고
    • Cambridge University Press Cambridge
    • Johnson KL (1987) Contact mechanics. Cambridge University Press, Cambridge
    • (1987) Contact Mechanics
    • Johnson, K.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.