![]() |
Volumn 202, Issue 10, 2008, Pages 1980-1984
|
Local characterization of electrodeposited Ni-W amorphous alloys by Auger microanalysis
|
Author keywords
Auger microanalysis; Electrodeposition; Homogeneous Ni W layer; Local SAM analysis
|
Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
ELECTRODEPOSITION;
MICROANALYSIS;
NICKEL ALLOYS;
SCANNING ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
LOCAL AUGER MICROANALYSIS;
X-RAY ELECTRON MICROANALYSIS;
AMORPHOUS ALLOYS;
AMORPHOUS ALLOYS;
AUGER ELECTRON SPECTROSCOPY;
ELECTRODEPOSITION;
MICROANALYSIS;
NICKEL ALLOYS;
SCANNING ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
|
EID: 38049145892
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2007.08.047 Document Type: Article |
Times cited : (15)
|
References (25)
|