Electron probe and auger electron microprobe characterization of modified Cu-based amorphous alloys

Microscopy and Microanalysis

Volumn 9, Issue 4, 2003, Pages 359-367

  Szummer, A ^a   Janik Czachor, M ^b   Mack, P ^c   Pisarek, M ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^c Thermo VG Scientific   (United Kingdom)

Author keywords

Amorphous alloys; Auger electron microprobe; Chemical modification; Cu based alloys; Microchemical analysis; X ray electron probe

Indexed keywords

EID: 0042284705     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927603030290     Document Type: Conference Paper

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