Fine tuning of quantum-dot pillar microcavities by focused ion beam milling

Applied Physics Letters

Volumn 92, Issue 1, 2008, Pages

  Lohmeyer, H ^a   Kalden, J ^a   Sebald, K ^a   Kruse, C ^a   Hommel, D ^a   Gutowski, J ^a  

^a UNIVERSITY OF BREMEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ION BEAMS; LUMINESCENCE; MICROCAVITIES;

BLUESHIFTED; EMISSION ENERGY; SEMICONDUCTOR PILLARS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 38049032285     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2827574     Document Type: Article

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