Characterization of cadmium telluride thin films fabricated by two-source evaporation technique and Ag doping by ion exchange process

Solid-State Electronics

Volumn 52, Issue 2, 2008, Pages 205-210

  Ali, A ^a   Abbas Shah, N ^a   Maqsood, A ^a  

^a QUAID I AZAM UNIVERSITY   (Pakistan)

Author keywords

07.30.Cy; 81.05.Dz; 81.15.Ef; 81.40.Tv; 82.56.Lz; Crystal structure; Optical microscopy; SEM; Substrate

Indexed keywords

ACTIVATION ENERGY; CADMIUM COMPOUNDS; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SUBSTRATES;

DARK CONDUCTIVITY; ROOM TEMPERATURE;

THIN FILMS;

EID: 38048999027     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2007.08.016     Document Type: Article

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