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Volumn 26, Issue 2, 1997, Pages 97-105

Substitutional-interstitial silver diffusion and drift in bulk (cadmium,mercury) telluride: Results and mechanistic implications

Author keywords

Diffusion; Electromigration; Mercury cadmium telluride

Indexed keywords

ELECTROMIGRATION; ENERGY GAP; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING CADMIUM COMPOUNDS; SILVER; SINGLE CRYSTALS;

EID: 0031076608     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-997-0095-7     Document Type: Article
Times cited : (19)

References (35)
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    • IEE Monograph Series 16, Herts. SSG1 1HQ, UK: Peter Peregrinus Ltd., Stevange
    • B. Tuck, Introduction to Diffusion in Semiconductors, IEE Monograph Series 16, (Herts. SSG1 1HQ, UK: Peter Peregrinus Ltd., Stevange, 1974).
    • (1974) Introduction to Diffusion in Semiconductors
    • Tuck, B.1
  • 14
    • 0000859230 scopus 로고
    • D. Cahen et al., Science 258 (Oct. 9), 271 (1992).
    • (1992) Science , vol.258 , Issue.OCT. 9 , pp. 271
    • Cahen, D.1
  • 18
    • 85176709954 scopus 로고    scopus 로고
    • C. Blaauw, F.R. Shephert and D. Eger, J. Appl. Phys. 66 (2), 605 (1989); I. Lyubomirsky, Appl. Phys. Lett. (2) (1997).
    • (1997) Appl. Phys. Lett. , Issue.2
    • Lyubomirsky, I.1
  • 23


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.