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Volumn 21, Issue 9, 2006, Pages 1296-1302

Investigation of Cu-containing low resistivity CdTe thin films deposited by the two-source evaporation technique

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; COPPER; DEPOSITION; ELECTRIC CONDUCTIVITY; EVAPORATION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING CADMIUM COMPOUNDS; SPECTROPHOTOMETERS; X RAY DIFFRACTION ANALYSIS;

EID: 33747236705     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/21/9/014     Document Type: Article
Times cited : (17)

References (23)
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    • Recent progress and critical issues in thin film polycrystalline solar cells and modules
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    • Birkmire, R.W.1
  • 6
    • 0032614850 scopus 로고    scopus 로고
    • Photoluminescence study of Cu diffusion and electromigration in CdTe
    • Grecu D and Compaan A D 1999 Photoluminescence study of Cu diffusion and electromigration in CdTe Appl. Phys. Lett. 75 361-3
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  • 7
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    • Bonnet, D.1
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    • Cadmium telluride films by metalorganic chemical vapor deposition
    • Chu T L, Chu S S, Ferekides C, Britt J and Wu C Q 1991 Cadmium telluride films by metalorganic chemical vapor deposition J. Appl. Phys. 69 7651-5
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    • Chu, T.L.1    Chu, S.S.2    Ferekides, C.3    Britt, J.4    Wu, C.Q.5
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.