The role of intrinsic defects for the diffusion of Ag and Cu in CdTe

Defect and Diffusion Forum

Volumn 237-240, Issue PART 1, 2005, Pages 491-496

  Wolf, H ^a   Wagner, F ^a   Wichert, Th ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

Defect reactions; II VI semiconductors; Intrinsic defects; Stoichiometry

Indexed keywords

COPPER; CRYSTAL DEFECTS; SEMICONDUCTING CADMIUM TELLURIDE; SILVER; STOICHIOMETRY; VAPOR PRESSURE;

DEFECT REACTIONS; INTRINSIC DEFECTS;

DIFFUSION;

EID: 18244380989     PISSN: 10120386     EISSN: 16629507     Source Type: Journal    
DOI: 10.4028/www.scientific.net/ddf.237-240.491     Document Type: Conference Paper

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