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Volumn 524-525, Issue , 2006, Pages 267-272

Aspects of residual stress determination using energy-dispersive synchrotron X-ray diffraction

Author keywords

Energy dispersive; Residual stress; Synchrotron X ray diffraction

Indexed keywords

ELONGATION; ENERGY DISPERSIVE SPECTROSCOPY; PROBLEM SOLVING; RESIDUAL STRESSES; X RAY DIFFRACTION;

EID: 37849013473     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-414-6.267     Document Type: Conference Paper
Times cited : (7)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.