Dielectric and ellipsometric studies of the dynamics in thin films of isotactic poly(methylmethacrylate) with one free surface

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 67, Issue 3 1, 2003, Pages

  Sharp, J S ^a   Forrest, J A ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC LOSSES; DIELECTRIC RELAXATION; ELECTRODES; ELLIPSOMETRY; EVAPORATION; EXTRAPOLATION; GLASS TRANSITION; PERMITTIVITY MEASUREMENT; PROBES; TEMPERATURE MEASUREMENT; THICKNESS MEASUREMENT; THIN FILMS;

DIELECTRIC LOSS MEASUREMENT; FREE SURFACE; LOSS PEAK;

POLYMETHYL METHACRYLATES;

EID: 37649031669     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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