Correction factors for low perturbation in vivo diodes used in the determination of entrance doses in high energy photon beams

Medical Physics

Volumn 35, Issue 1, 2008, Pages 25-31

  Roberts, Ralph ^a   Philp, Amanda ^b  

^a OXFORD UNIVERSITY HOSPITALS NHS FOUNDATION TRUST   (United Kingdom)

^b GLOUCESTERSHIRE ROYAL HOSPITAL   (United Kingdom)

Author keywords

Correction factor; Diodes; Dose perturbation; Entrance dose; In vivo dosimetry

Indexed keywords

DOSIMETRY; PARTICLE BEAMS; PHOTOELECTRONS; PHOTONS;

CORRECTION FACTORS; DOSE PERTURBATION; ENTRANCE DOSE; HIGH-ENERGY PHOTON BEAMS; IN-VIVO; INTERMEDIATE RESULTS; METHODS AND MATERIALS; SOURCE-SURFACE DISTANCE;

DIODES;

EPOXIDE; SILICON;

ACCURACY; ARTICLE; CALIBRATION; DIODE; DOSIMETRY; ELECTRIC POTENTIAL; ENCAPSULATION; ENERGY; MATHEMATICAL ANALYSIS; MEASUREMENT; PHOTON; PRIORITY JOURNAL; RADIATION BEAM; THICKNESS;

EID: 37549064756     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.2818729     Document Type: Article

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