Alternate loop-back diagnostic tests for wafer-level diagnosis of modern wireless transceivers using spectral signatures

Proceedings of the IEEE VLSI Test Symposium

Volumn 2006, Issue , 2006, Pages 222-227

  Srinivasan, Ganesh ^a   Chatterjee, Abhijit ^a   Taenzler, Friedrich ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTINUOUS WAVE SIGNALS; LOOP-BACK METHODS; RF TRANSCEIVERS;

ELECTRONIC DOCUMENT IDENTIFICATION SYSTEMS; MEASUREMENT THEORY; SYSTEMS ANALYSIS; TRANSCEIVERS; WSI CIRCUITS;

WIRELESS TELECOMMUNICATION SYSTEMS;

EID: 33751116117     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2006.17     Document Type: Conference Paper

References (12)

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