XPS characterization of sensitized n-TiO 2 thin films for dye-sensitized solar cell applications

Applied Surface Science

Volumn 254, Issue 6, 2008, Pages 1874-1879

  Patrocínio, Antonio Otávio T ^a   Paniago, Eucler B ^b   Paniago, Roberto M ^c   Iha, Neyde Y Murakami ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

^b FEDERAL UNIVERSITY OF OURO PRETO   (Brazil)

^c FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

Author keywords

Dye sensitized solar cells; Sputtering; TiO 2; XPS

Indexed keywords

SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SPUTTERING; SURFACE STRUCTURE; THIN FILMS; TITANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

ARGON-ION SPUTTERING; DYE-SENSITIZED SOLAR CELL APPLICATIONS; SENSITIZED FILMS;

SOLAR CELLS;

EID: 37349126744     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.07.185     Document Type: Article

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