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Volumn 10, Issue 9, 1998, Pages 2533-2541

Structure of Organic/Inorganic Interface in Assembled Materials Comprising Molecular Components. Crystal Structure of the Sensitizer Bis[(4,4′-carboxy-2,2′-bipyridine)(thiocyanato)]ruthenium(II)

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EID: 0000568140     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm980303g     Document Type: Article
Times cited : (251)

References (19)
  • 9
    • 0003523327 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, WI
    • Sheldrick, G. M. SHELXTL PLUS. VAX/VMS Version; Siemens Analytical X-ray Instruments Inc., Madison, WI, 1990.
    • (1990) SHELXTL PLUS. VAX/VMS Version
    • Sheldrick, G.M.1
  • 15
    • 0542380749 scopus 로고
    • Braginsky, L. S.; Romanov, D. A. Fiz. Tverd. Tela (St. Peterburg) 1995 37, 2122 [Sov. Phys. Solid State 1995, 37].
    • (1995) Sov. Phys. Solid State , vol.37
  • 18
    • 0542428274 scopus 로고    scopus 로고
    • Braginsky, L. S.; Romanov, D. A. Fiz. Tverd. Tela (St. Peterburg) 1997, 38, 839 [Sov. Phys. Solid State 1997, 39].
    • (1997) Sov. Phys. Solid State , vol.39


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.