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Volumn 254, Issue 6, 2008, Pages 1694-1699

Spectroscopic ellipsometric characterization of TiAlN/TiAlON/Si 3 N 4 tandem absorber for solar selective applications

Author keywords

Ellipsometry; Solar selective coating

Indexed keywords

COATINGS; COPPER COMPOUNDS; DATA REDUCTION; SPECTROSCOPIC ELLIPSOMETRY; SPUTTER DEPOSITION;

EID: 37349121187     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.07.109     Document Type: Article
Times cited : (77)

References (20)
  • 5
    • 37349077477 scopus 로고    scopus 로고
    • Proceedings of 2nd International Conference on Spectroscopic Ellipsometry, Charleston, South Carolina, 12-15 May 1997, Thin Solid Films 313/314 (1998).
  • 6
    • 37349070583 scopus 로고    scopus 로고
    • Proceedings of 1st International Conference on Spectroscopic Ellipsometry, Paris, 11-14 January, 1993, Thin Solid Films 233/234 (1993).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.