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Volumn 254, Issue 6, 2008, Pages 1694-1699
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Spectroscopic ellipsometric characterization of TiAlN/TiAlON/Si 3 N 4 tandem absorber for solar selective applications
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Author keywords
Ellipsometry; Solar selective coating
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Indexed keywords
COATINGS;
COPPER COMPOUNDS;
DATA REDUCTION;
SPECTROSCOPIC ELLIPSOMETRY;
SPUTTER DEPOSITION;
SOLAR SELECTIVE APPLICATIONS;
TITANIUM COMPOUNDS;
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EID: 37349121187
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2007.07.109 Document Type: Article |
Times cited : (77)
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References (20)
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