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Volumn 19, Issue 3, 2001, Pages 922-929

Structural and optical properties of titanium aluminum nitride films (Ti1-xAlxN)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; FILM GROWTH; GRAIN BOUNDARIES; LIGHT ABSORPTION; MAGNETRON SPUTTERING; PHOTOELECTRON SPECTROSCOPY; SOLID SOLUTIONS; SPECTROPHOTOMETRY; SURFACE ROUGHNESS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0035334043     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1359532     Document Type: Article
Times cited : (66)

References (33)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.