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Volumn 19, Issue 3, 2001, Pages 922-929
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Structural and optical properties of titanium aluminum nitride films (Ti1-xAlxN)
a a a a b b a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL ATOMIC STRUCTURE;
CRYSTAL ORIENTATION;
FILM GROWTH;
GRAIN BOUNDARIES;
LIGHT ABSORPTION;
MAGNETRON SPUTTERING;
PHOTOELECTRON SPECTROSCOPY;
SOLID SOLUTIONS;
SPECTROPHOTOMETRY;
SURFACE ROUGHNESS;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
INFRARED ABSORPTION;
TITANIUM ALUMINUM NITRIDE FILMS;
TITANIUM COMPOUNDS;
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EID: 0035334043
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1359532 Document Type: Article |
Times cited : (66)
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References (33)
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