Surface analysis of thermally annealed porous silicon

Applied Surface Science

Volumn 254, Issue 6, 2008, Pages 1837-1841

  Banerjee, M ^a   Bontempi, E ^b   Tyagi, A K ^c   Basu, S ^a   Saha, H ^a  

^a JADAVPUR UNIVERSITY   (India)

^b UNIVERSITY OF BRESCIA   (Italy)

^c INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

Porous silicon; Surface analysis; Thermal annealing

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SURFACE ANALYSIS; X RAY DIFFRACTION;

ELECTROCHEMICAL ANODIZATION; PHOTOVOLTAIC APPLICATION; SOLAR SPECTRUM; THERMAL ANNEALING;

POROUS SILICON;

EID: 37349101737     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.07.166     Document Type: Article

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