Roughness of the porous silicon dissolution interface

Journal of Applied Physics

Volumn 81, Issue 9, 1997, Pages 6171-6178

  Lerondel G ^a   Romestain, R ^a   Barret, S ^a  

^a UNIV GRENOBLE ALPES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000022493     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364400     Document Type: Article

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