Energy transfer from Gd to Er atoms in SiO2(GdEr)-MOSLEDs produced by ion implantation

Materials Science and Engineering: B

Volumn 146, Issue 1-3, 2008, Pages 241-244

  Prucnal, S ^a   Sun, J M ^a   Rebohle, L ^a   Skorupa, W ^a  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

Electroluminescence; MOSLED; Rare earth; SiO2

Indexed keywords

CONCENTRATION (PROCESS); ELECTROLUMINESCENCE; EXCITATION ENERGY; GADOLINIUM; ION IMPLANTATION; LIGHT EMITTING DIODES; MOS DEVICES;

INFRARED LUMINESCENCE; MOSLED; RADIATIVE TRANSITIONS; WEAK LUMINESCENCE;

ERBIUM COMPOUNDS;

EID: 37349077180     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2007.07.033     Document Type: Article

References (14)

1. Ossicini S., Pavesi L., and Priolo F. Light Emitting Silicon for Microphotonics vol. 194 (2003), Springer Springer Tracts in Modern Physics
2. Polman A. Nat. Mater. 1 (2002) 10-12
3. Castagna M.E., Coffa S., Monaco M., Muscara A., Caristia L., Lorenti S., and Messina A. Mater. Sci. Eng. B 105 (2003) 83-90
4. Sun J.M., Skorupa W., Dekorsy T., Helm M., and Nazarov A.N. Opt. Mater. 27 (2005) 1050-1054
5. Sun J.M., Skorupa W., Dekorsy T., Helm M., Rebohle L., and Gebel T. J. Appl. Phys. 97 (2005) 123513
6. Sun J.M., Prucnal S., Skorupa W., Dekorsy T., Helm M., Rebohle L., and Gebel T. Appl. Phys. Lett. 89 (2006) 091908
7. Sun J.M., Skorupa W., Dekorsy T., Helm M., Rebohle L., and Gebel T. Appl. Phys. Lett. 85 (2004) 3387-3389
8. Rebohle L., Gebel T., Yankov R.A., Trautmann T., Skorupa W., Sun J.M., Gauglitz G., and Frank R. Opt. Mater. 27 (2005) 1055
9. Skorupa W., Rebohle L., and Gebel T. Appl. Phys. B 76 (2003) 1049
10. Guo H., Li Y., Wang D., Zhang W., Yin M., Lou L., and Xia S. J. Alloys Compd. 376 (2004) 23
11. Xu H., and Jiang Z. Phys. Rev. B 66 (2002) 035103
12. Auzel F., Chen Y., and Meichenin D. J. Lumin. 60-61 (1994) 692
13. Prucnal S., Sun J.M., Muecklich A., and Skorupa W. Electrochem. Solid-State Lett. 10 (2007) H50-H52
14. Sun J.M., Prucnal S., Skorupa W., Dekorsy T., Müchlich A., Rebohle L., Gebel T., and Helm M. J. Appl. Phys. 99 (2006) 103102