Nonstoichiometry and electrical conduction of CuO

Journal of Physics and Chemistry of Solids

Volumn 57, Issue 1, 1996, Pages 81-84

  Jeong, Yong Kwon ^a,b   Choi, Gyeong Man ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Lucky R and D Center   (South Korea)

Author keywords

A. ceramics; C. thermogravimetric analysis (TGA); D. defects; D. electrical conductivity; D. electrical properties

Indexed keywords

ACTIVATION ENERGY; CERAMIC MATERIALS; CHARGE CARRIERS; COPPER; CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY OF SOLIDS; ENERGY GAP; ENTHALPY; LOW TEMPERATURE EFFECTS; SINTERING; THERMOELECTRICITY; THERMOGRAVIMETRIC ANALYSIS;

COPPER VACANCIES; DEFECT GENERATION REACTION; NONSTOICHIOMETRY;

COPPER OXIDES;

EID: 0029772676     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3697(95)00130-1     Document Type: Article

References (13)

1. Bednorz J. G. and Muller K. A., Z. Phys. B64, 189 (1986).
2. Ghosh A. and Chakravorty D., J. Phys. Condens. Mater. 2, 5365 (1990).
3. Jun S. T. and Choi G. M., Sensors and Actuators B 17, 175 (1992).
4. Kofstad P., Nonstoichiometry, Diffusion and Electrical Conductivity in Binary Metal Oxides. John Wiley & Sons, Inc., New York, 1972.
5. Ahn Y. P. and Lee H. D., J. Kor. Ceram. Soc. 20, 161 (1982).
6. Azzoni C. B., Parravicini G. B. and Samogia G., Z. Naturforsch. 45a, 790 (1990).
7. Xue J. and Dickmann R., J. Phys. Chem. Solids 51, 1263 (1990).
8. Fan C. and Rahaman M. N., J. Am. Ceram. Soc. 75(8), 2056 (1992).
9. French J. D., Chan H. M., Harmer M. P. and Miller G. A., J. Am. Ceram. Soc. 75(2), 418 (1992).
10. Koffberg F. P. and Benko F. A., J. Appl. Phys. 53(2), 1173 (1982).
11. Kroeger F. A. and Vink V. J., Solid State Phys. 3, 307 (1956).
12. Lindemer T. B., Hunley J. F., Gates J. E., Sutton Jr A. L., Brynestad J., Hubbard C. R. and Gallagher P. K., J. Am. Ceram. Soc. 72(10), 1775 (1989).
13. Dickmann R., MRS Bull. 16(12), 27 (1991).