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Volumn 35, Issue 3, 1996, Pages 1806-1813
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Improvement of the sintering and dielectric characteristics of surface barrier layer capacitors by CuO addition
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Author keywords
Anneal; Grain size; Reduction; Reoxidation; Threshold time
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Indexed keywords
ADDITION REACTIONS;
ANNEALING;
CALCINATION;
COPPER OXIDES;
DIELECTRIC PROPERTIES;
MAGNESIA;
PERMITTIVITY;
REDOX REACTIONS;
SEMICONDUCTOR DEVICE MANUFACTURE;
SINTERING;
SURFACE TREATMENT;
SYNTHESIS (CHEMICAL);
BARIUM STRONTIUM TITANIUM ZIRCONIUM OXIDE;
COPPER OXIDE ADDITION;
SEMICONDUCTIVE CERAMICS;
SURFACE BARRIER LAYER CAPACITORS;
CAPACITORS;
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EID: 0030103218
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.35.1806 Document Type: Article |
Times cited : (91)
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References (20)
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