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Volumn 35, Issue 3, 1996, Pages 1806-1813

Improvement of the sintering and dielectric characteristics of surface barrier layer capacitors by CuO addition

Author keywords

Anneal; Grain size; Reduction; Reoxidation; Threshold time

Indexed keywords

ADDITION REACTIONS; ANNEALING; CALCINATION; COPPER OXIDES; DIELECTRIC PROPERTIES; MAGNESIA; PERMITTIVITY; REDOX REACTIONS; SEMICONDUCTOR DEVICE MANUFACTURE; SINTERING; SURFACE TREATMENT; SYNTHESIS (CHEMICAL);

EID: 0030103218     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.1806     Document Type: Article
Times cited : (91)

References (20)
  • 1
    • 0019667819 scopus 로고
    • American Ceramic Society, Westerville
    • R. Wernicke: Advances in Ceramics (American Ceramic Society, Westerville, 1981) Vol. I, p. 261.
    • (1981) Advances in Ceramics , vol.1 , pp. 261
    • Wernicke, R.1
  • 4
    • 0019698791 scopus 로고
    • American Ceramic Society, Westerville
    • N. Yamaoka and T. Matsui: Advances in Ceramics (American Ceramic Society, Westerville, 1981) Vol. I, p. 232.
    • (1981) Advances in Ceramics , vol.1 , pp. 232
    • Yamaoka, N.1    Matsui, T.2
  • 5
    • 0019691681 scopus 로고
    • American Ceramic Society, Westerville
    • G. Goodman: Advances in Ceramics (American Ceramic Society, Westerville, 1981) Vol. I, p. 215.
    • (1981) Advances in Ceramics , vol.1 , pp. 215
    • Goodman, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.