Phase-sensitive electric-field-induced second-harmonic microscopy of metal-semiconductor junctions

Journal of the Optical Society of America B: Optical Physics

Volumn 24, Issue 10, 2007, Pages 2736-2740

  Wu, K ^a   Carriles, R ^a   Downer, M C ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; ELECTRIC FIELDS; HARMONIC GENERATION; OPTICAL MICROSCOPY;

SECOND HARMONIC LIGHT; SUBMICROMETER SPATIAL RESOLUTION;

SEMICONDUCTOR JUNCTIONS;

EID: 36949018173     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.24.002736     Document Type: Article

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