Electric-field-induced second-harmonic microscopy

Physica Status Solidi C: Conferences

Volumn , Issue 8, 2003, Pages 3081-3085

  Wu, K ^a   Canterbury, J D ^a,b   Wilson, P T ^a   Downer, M C ^a  

^a The University of Texas at Austin   (United States)

^b UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONFOCAL SCANNING; ELECTRIC FIELD DISTRIBUTIONS; LATERAL RESOLUTION; NONLINEAR OPTICAL MICROSCOPES; PROJECTION IMAGING; SECOND-HARMONIC; SECOND-HARMONIC MICROSCOPY; SUBMICRON;

ELECTRIC FIELDS;

EID: 36949036095     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200303853     Document Type: Conference Paper

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