Localization-induced inhomogeneous screening of internal electric fields in AlGaN-based quantum wells

Applied Physics Letters

Volumn 91, Issue 23, 2007, Pages

  Murotani, Hideaki ^a   Saito, Takuya ^a   Kato, Nobuo ^a   Yamada, Yoichi ^a   Taguchi, Tsunemasa ^a   Ishibashi, Akihiko ^b   Kawaguchi, Yasutoshi ^b   Yokogawa, Toshiya ^b  

^a YAMAGUCHI UNIVERSITY   (Japan)

^b PANASONIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM GALLIUM NITRIDE; ELECTRIC FIELDS; OPTICAL MICROSCOPY; PHOTOLUMINESCENCE;

ILLUMINATION-COLLECTION MODE; INHOMOGENEOUS SCREENING;

SEMICONDUCTOR QUANTUM WELLS;

EID: 36849006367     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2817749     Document Type: Article

References (13)

1. P. A. Crowell, D. K. Young, S. Keller, E. L. Hu, and D. D. Awshalom, Appl. Phys. Lett. 72, 927 (1998).
2. D. K. Young, M. P. Mack, A. C. Abare, M. Hansen, L. A. Coldren, S. P. Denbaars, E. L. Hu, and D. D. Awschalom, Appl. Phys. Lett. 74, 2349 (1999).
3. V. Vertikov, M. Kuball, A. V. Nurmikko, Y. Chen, and S.-Y. Wang, Appl. Phys. Lett. 72, 2645 (1998).
4. A. Vertikov, A. V. Nurmikko, K. Doverspike, G. Bulman, and J. Edmond, Appl. Phys. Lett. 73, 493 (1998).
5. A. Vertikov, I. Ozden, and A. V. Nurmikko, Appl. Phys. Lett. 74, 850 (1999).
6. M. J. Jeong, J. Y. Kim, Y.-M. Kim, J. O. White, E.-K. Suh, C.-H. Hong, and H. J. Lee, Appl. Phys. Lett. 79, 976 (2001).
7. M. J. Jeong, Y.-M. Kim, J. O. White, E.-K. Suh, M. G. Cheong, C. S. Kim, C.-H. Hong, and H. J. Lee, Appl. Phys. Lett. 79, 3440 (2001).
8. J. Y. Kim, K. Samiee, J. O. White, J.-M. Myoung, and K. K. Kim, Appl. Phys. Lett. 80, 989 (2002).
9. A. Kaneta, K. Okamoto, Y. Kawakami, Sg. Fujita, G. Marutsuki, Y. Narukawa, and T. Mukai, Appl. Phys. Lett. 81, 4353 (2002).
10. A. Kaneta, T. Mutoh, Y. Kawakami, Sg. Fujita, G. Marutsuki, Y. Narukawa, and T. Mukai, Appl. Phys. Lett. 83, 3462 (2003).
11. H. Amano and I. Akasaki, in Properties, Processing and Applications of Gallium Nitride and Related Semiconductors, edited by, J. H. Edgar, S. Strite, I. Akasaki, H. Amano, and, C. Wetzel, (INSPEC, London, 1999), Vol. 23, p. 139.
12. H. Hirayama, J. Appl. Phys. 97, 091101 (2005).
13. Y. Yamada, Y. Ueki, K. Nakamura, T. Taguchi, A. Ishibashi, Y. Kawaguchi, and T. Yokogawa, Phys. Rev. B 70, 195210 (2004).