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Volumn 19, Issue 24, 2007, Pages 1994-1996

Low-temperature bonding of laser diode chips on silicon substrates using plasma activation of Au films

Author keywords

Flip chip bonding; Hybrid integration; Low temperature bonding

Indexed keywords

FLIP CHIP DEVICES; GOLD; PLASMA APPLICATIONS; SILICON; SUBSTRATES; SURFACE EMITTING LASERS;

EID: 36849000258     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2007.908642     Document Type: Article
Times cited : (114)

References (10)
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  • 2
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    • E. Higurashi and R. Sawada, "Micro-encoder based on higher-order diffracted light interference," J. Micromech. Microeng., vol. 15, pp. 1459-1465, Jun. 2005.
    • (2005) J. Micromech. Microeng , vol.15 , pp. 1459-1465
    • Higurashi, E.1    Sawada, R.2
  • 3
    • 0003666893 scopus 로고
    • H. Okamoto and T. B. Massalski, Eds, Metals Park, OH: ASM
    • H. Okamoto and T. B. Massalski, Eds., Phase Diagram of Binary Gold Alloys. Metals Park, OH: ASM, 1987, pp. 278-289.
    • (1987) Phase Diagram of Binary Gold Alloys , pp. 278-289
  • 5
    • 0031144706 scopus 로고    scopus 로고
    • Thermosonic bonding of an optical transceiver based on an 8 × 8 vertical cavity surface emitting laser array
    • May
    • T. S. McLaren, S. Y. Kang, W. Zhang, T. H. Ju, and Y. C. Lee, "Thermosonic bonding of an optical transceiver based on an 8 × 8 vertical cavity surface emitting laser array," IEEE Trans. Compon. Packag. Manuf. Technol. B, vol. 20, no. 2, pp. 152-160, May 1997.
    • (1997) IEEE Trans. Compon. Packag. Manuf. Technol. B , vol.20 , Issue.2 , pp. 152-160
    • McLaren, T.S.1    Kang, S.Y.2    Zhang, W.3    Ju, T.H.4    Lee, Y.C.5
  • 6
    • 0035300808 scopus 로고    scopus 로고
    • M. Hizukuri, N. Watanabe, and T. Asano, Dynamic strain and chip damage during ultrasonic flip chip bonding, Jpn. J. Appl. Phys., 40, no. 4B, pt. 1, pp. 3044-3048, Apr. 2001.
    • M. Hizukuri, N. Watanabe, and T. Asano, "Dynamic strain and chip damage during ultrasonic flip chip bonding," Jpn. J. Appl. Phys., vol. 40, no. 4B, pt. 1, pp. 3044-3048, Apr. 2001.
  • 10
    • 0022069093 scopus 로고
    • A quantitative analysis of solid state bonding process based on fundamental bonding mechanisms (Part 1)-Modeling and numerical analysis of bonding process, (in Japanese)
    • K. Nishiguchi and Y. Takahashi, "A quantitative analysis of solid state bonding process based on fundamental bonding mechanisms (Part 1)-Modeling and numerical analysis of bonding process," (in Japanese) Q. J. Jpn. Weld. Soc., vol. 3, pp. 303-315, 1985.
    • (1985) Q. J. Jpn. Weld. Soc , vol.3 , pp. 303-315
    • Nishiguchi, K.1    Takahashi, Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.