PbI2 thick films: Growth, properties, and problems

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 584, Issue 1, 2008, Pages 165-173

  Dmitriev, Yuri ^a   Bennett, Paul R ^a   Cirignano, Leonard J ^a   Klugerman, Mikhail ^a   Shah, Kanai S ^a  

^a RADIATION MONITORING DEVICES INC   (United States)

Author keywords

Dark current; Lead iodide; Sensitivity; Thick films; X ray

Indexed keywords

IRRIGATION; LEAD COMPOUNDS; PHYSICAL PROPERTIES; PHYSICAL VAPOR DEPOSITION; POLYCRYSTALLINE MATERIALS; X RAY ANALYSIS;

DARK CURRENT; GLASS SUBSTRATES; LEAD IODIDE;

METALLIC FILMS;

EID: 36749025659     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.10.008     Document Type: Article

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