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Volumn 78, Issue 5, 2007, Pages
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Simple experimental method for alpha particle range determination in lead iodide films
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Author keywords
[No Author keywords available]
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Indexed keywords
ALPHA PARTICLES;
DARK CURRENTS;
OHMMETERS;
OPTICAL FILMS;
SURFACE DEFECTS;
THICKNESS MEASUREMENT;
ALPHA PARTICLE RADIATIONS;
LEAD IODIDE FILMS;
OHM'S LAW;
RANGE DETERMINATION;
RANGE FINDING;
IODIDE;
LEAD;
ALPHA RADIATION;
ARTICLE;
CHEMISTRY;
EVALUATION;
FILM DOSIMETER;
LINEAR ENERGY TRANSFER;
METHODOLOGY;
RADIATION DOSE;
RADIATION EXPOSURE;
RADIATION RESPONSE;
RADIATION SCATTERING;
ALPHA PARTICLES;
DOSE-RESPONSE RELATIONSHIP, RADIATION;
FILM DOSIMETRY;
IODIDES;
LEAD;
LINEAR ENERGY TRANSFER;
RADIATION DOSAGE;
SCATTERING, RADIATION;
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EID: 34249930584
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2741369 Document Type: Article |
Times cited : (12)
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References (15)
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