G-SIMS-FPM: Molecular structure at surfaces-a combined positive and negative secondary ion study

Applied Surface Science

Volumn 252, Issue 19, 2006, Pages 6601-6604

  Gilmore, I S ^a   Green, F M ^a   Seah, M P ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

G SIMS; Identification; Interpretation; Molecular structure; Static SIMS

Indexed keywords

DATA REDUCTION; MOLECULAR DYNAMICS; MOLECULAR STRUCTURE; PROBLEM SOLVING; SURFACE PHENOMENA;

G-SIMS; IDENTIFICATION; INTERPRETATION; STATIC SIMS;

SECONDARY ION MASS SPECTROMETRY;

EID: 33747188934     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.220     Document Type: Article

References (7)

1. Gilmore I.S., and Seah M.P. Appl. Surf. Sci. 161 (2000) 465
2. Gilmore I.S., and Seah M.P. Appl. Surf. Sci. 203-204 (2003) 551
3. Gilmore I.S., and Seah M.P. Appl. Surf. Sci. 231-232 (2004) 224
4. R. Ogaki, M.C. Davies, I.S. Gilmore, M. Alexander, these proceedings.
5. P.N. Hawtin, J.F. Watts, M.-L. Abel, these proceedings.
6. Green F.M., Gilmore I.S., and Seah M.P. J. Am. Soc. Mass Spectrosc. 17 (2006) 514
7. J.C. Vickerman, D. Briggs, A. Henderson, The Static SIMS Library, SurfaceSpectra Ltd., Manchester, 1998.