Microlens-integrated large-area InAlGaAs-InAlAs superlattice APD's for eye-safety 1.5-μm wavelength optical measurement use

IEEE Photonics Technology Letters

Volumn 10, Issue 3, 1998, Pages 576-578

  Hayashi, M ^a   Watanabe, I ^a   Nakata, T ^a   Tsuji, M ^a   Makita, K ^a   Yamakata, S ^a   Taguchi, K ^a  

^a NEC CORPORATION   (Japan)

Author keywords

Avalanche photodiode; Microlens; Optical measurement; Superlattice

Indexed keywords

AVALANCHE DIODES; ELECTRIC CURRENTS; INTEGRATED OPTICS; LIGHT MEASUREMENT; OPTICAL INSTRUMENT LENSES; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR SUPERLATTICES;

DARK CURRENTS;

PHOTODIODES;

EID: 3643105251     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

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