High strength and high electrical conductivity in bulk nanograined Cu embedded with nanoscale twins

Applied Physics Letters

Volumn 91, Issue 21, 2007, Pages

  Zhang, Y ^a   Li, Y S ^a   Tao, N R ^a   Lu, K ^a  

^a INSTITUTE OF METAL RESEARCH   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENICS; ELECTRIC CONDUCTIVITY; TENSILE STRENGTH; YIELD STRESS;

CRYOGENIC TEMPERATURES; NANOSCALE TWINS; ROOM TEMPERATURE;

COPPER;

EID: 36349004658     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2816126     Document Type: Article

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