Readout durability improvement of super-resolution near-field structure disc using germanium nitride interface layers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6620, Issue , 2007, Pages

  Shima, Takayuki ^a   Yamakawa, Yuzo ^a   Tominaga, Junji ^a   Kim, Jooho ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b SAMSUNG Electronics   (South Korea)

Author keywords

Combined marks; Germanium nitride; Sb Te; Super resolution readout durability; ZnS SiO 2

Indexed keywords

DURABILITY; GERMANIUM COMPOUNDS; PLATINUM COMPOUNDS; SILICA; THIN FILMS; WAVEFORM ANALYSIS;

GERMANIUM NITRIDE; INTERFACE LAYERS; NEAR-FIELD STRUCTURE DISC;

OPTICAL DATA STORAGE;

EID: 36249010363     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.738929     Document Type: Conference Paper

References (12)

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