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Volumn 6282, Issue , 2006, Pages
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Error rate improvement of Super-RENS random signal with the minimum mark length of 75nm in 405nm, 0.85 NA system
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Author keywords
bER characteristics; Super RENS; Super resolution; Write once
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Indexed keywords
BIT ERROR RATE;
MAXIMUM LIKELIHOOD ESTIMATION;
OPTICAL DISK STORAGE;
OPTICAL RESOLVING POWER;
RESPONSE TIME (COMPUTER SYSTEMS);
SIGNAL PROCESSING;
BLUE LASER OPTICAL SYSTEM;
CARRIER LEVEL (CL);
SUPER-RENS;
SUPER-RESOLUTION;
ERROR CORRECTION;
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EID: 33748068821
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.685237 Document Type: Conference Paper |
Times cited : (8)
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References (12)
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