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Volumn 6282, Issue , 2006, Pages

Error rate improvement of Super-RENS random signal with the minimum mark length of 75nm in 405nm, 0.85 NA system

Author keywords

bER characteristics; Super RENS; Super resolution; Write once

Indexed keywords

BIT ERROR RATE; MAXIMUM LIKELIHOOD ESTIMATION; OPTICAL DISK STORAGE; OPTICAL RESOLVING POWER; RESPONSE TIME (COMPUTER SYSTEMS); SIGNAL PROCESSING;

EID: 33748068821     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.685237     Document Type: Conference Paper
Times cited : (8)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.