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Volumn 254, Issue 4, 2007, Pages 1224-1227

Morphological and structural characterizations of CrSi 2 nanometric films deposited by laser ablation

Author keywords

Electron microscopy; Pulsed laser deposition; Thin film; X ray diffraction; X ray reflectivity

Indexed keywords

CHEMICAL ANALYSIS; CHROMIUM COMPOUNDS; FILM GROWTH; LASER ABLATION; PULSED LASER DEPOSITION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 36248952242     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.09.026     Document Type: Article
Times cited : (5)

References (13)
  • 9
    • 36248986840 scopus 로고    scopus 로고
    • Version 3.03 Bruker AXS GmbH, 2005.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.