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Volumn 254, Issue 4, 2007, Pages 1224-1227
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Morphological and structural characterizations of CrSi 2 nanometric films deposited by laser ablation
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Author keywords
Electron microscopy; Pulsed laser deposition; Thin film; X ray diffraction; X ray reflectivity
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Indexed keywords
CHEMICAL ANALYSIS;
CHROMIUM COMPOUNDS;
FILM GROWTH;
LASER ABLATION;
PULSED LASER DEPOSITION;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
CHROMIUM DISILICIDE;
ROOM TEMPERATURE;
X-RAY REFLECTIVITY (XRR);
THIN FILMS;
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EID: 36248952242
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2007.09.026 Document Type: Article |
Times cited : (5)
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References (13)
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