메뉴 건너뛰기




Volumn 582, Issue 3, 2007, Pages 849-853

Silicon Drift Detectors development for position sensing

Author keywords

Compton imaging; Controlled Drift Detectors; Electron tracking; Silicon Drift Detectors; X ray imaging; X ray spectroscopy

Indexed keywords

COMPTON SCATTERING; ELECTRONS; IMAGING TECHNIQUES; TWO DIMENSIONAL;

EID: 36148973179     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.07.109     Document Type: Article
Times cited : (4)

References (23)
  • 3
  • 15
    • 36148954174 scopus 로고    scopus 로고
    • E.U. Patent no. EP0862226, US Patent no. US 6,249,033.
  • 22
    • 0031366929 scopus 로고    scopus 로고
    • C.E. Ordonez, A. Bolozdynya, W. Chang, in: Proceedings of the IEEE Nuclear Science Symposium, 1997, p. 1361.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.