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Surface and Coatings Technology

Volumn 202, Issue 4-7, 2007, Pages 786-789

Characterization of quaternary (Cr,Al)N-based films synthesized by the cathodic arc method

(5) Hasegawa, H a Ohashi, K a Tsukamoto, S a Sato, T b Suzuki, T b

a OKAYAMA UNIVERSITY (Japan)

b KEIO UNIVERSITY (Japan)

Author keywords

(Cr,Al)N; Microhardness; Microstructure; Thermal stability

Indexed keywords

ANNEALING; CHARACTERIZATION; CRYSTAL MICROSTRUCTURE; LATTICE CONSTANTS; MICROHARDNESS; SYNTHESIS (CHEMICAL); THERMODYNAMIC STABILITY;

CATHODIC ARC METHOD; CHROMIUM ALUMIMUM NITRIDE;

NITROGEN COMPOUNDS;

ANNEALING; CHARACTERIZATION; CRYSTAL MICROSTRUCTURE; LATTICE CONSTANTS; MICROHARDNESS; NITROGEN COMPOUNDS; SYNTHESIS (CHEMICAL); THERMODYNAMIC STABILITY;

EID: 36049044516 PISSN: 02578972 EISSN: None Source Type: Journal
DOI: 10.1016/j.surfcoat.2007.05.050 Document Type: Article

Times cited : (10)

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