Nucleation of 3C-SiC on 6H-SiC from a liquid phase

Acta Materialia

Volumn 55, Issue 20, 2007, Pages 6873-6880

  Soueidan, Maher ^a,b   Ferro, Gabriel ^a   Kim Hak, Olivier ^a   Robaut, Florence ^c   Dezellus, Olivier ^a   Dazord, Jacques ^a   Cauwet, François ^a   Viala, Jean Claude ^a   Nsouli, Bilal ^b  

^a UNIVERSITÉ CLAUDE BERNARD LYON 1   (France)

^b NATIONAL COUNCIL FOR SCIENTIFIC RESEARCH   (Lebanon)

^c Grenoble INP   (France)

Author keywords

Atomic force microscopy (AFM); Carbides; Electron backscattering diffraction (EBSD); Semiconductor; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBIDES; NUCLEATION; PROPANE; SUBSTRATES; SUPERSATURATION; THIN FILMS;

ELECTRON BACKSCATTERING DIFFRACTION (EBSD); POLYTYPE SELECTION; SOLID MECHANISM;

FLUID DYNAMICS;

EID: 36048991466     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2007.08.046     Document Type: Article

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