Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary

Micron

Volumn 39, Issue 1, 2008, Pages 45-52

  Pérez Willard, Fabián ^a   Wolde Giorgis, Daniel ^b   Al Kassab, Talaát ^b   López, Gabriel A ^c   Mittemeijer, Eric J ^c   Kirchheim, Reiner ^b   Gerthsen, Dagmar ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

^c UNIVERSITY OF STUTTGART   (Germany)

Author keywords

Atom probe; Focused ion beam; Grain boundary; Sample preparation; Segregation

Indexed keywords

COPPER; CRYSTALLOGRAPHY; FOCUSED ION BEAMS; GRAIN BOUNDARY SLIDING; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

APEX REGIONS; ATOM PROBES; CRYSTALLOGRAPHIC ORIENTATION; SAMPLE PREPARATION;

MEDICAL IMAGING;

EID: 35748964467     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2007.01.001     Document Type: Article

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