Polarization retention loss in PbTi O3 ferroelectric films due to leakage currents

Journal of Applied Physics

Volumn 102, Issue 8, 2007, Pages

  Morelli, A ^a   Venkatesan, Sriram ^a   Palasantzas, G ^a   Kooi, B J ^a   De Hosson, J Th M ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; FERROELECTRIC FILMS; LEAKAGE CURRENTS; POLARIZATION; POLYCRYSTALLINE MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

PIEZORESPONSE; POLYCRYSTALLINE FILMS; RETENTION LOSS;

LEAD COMPOUNDS;

EID: 35648994336     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2794859     Document Type: Article

References (21)

1. J. F. Scott and C. A. Araujo, Science 246, 1400 (1989).
2. C. A. Paz de Araujo, J. D. Cuchiaro, L. D. McMillan, M. C. Scott, and J. F. Scott, Nature (London) 374, 627 (1995).
3. F. Jona and G. Shirane, Ferroelectric Crystals (Pergamon, Oxford, 1962), p. 46.
4. T. Hidaka, T. Mayurama, M. Saitoh, N. Mikoshiba, M. Shimizu, T. Shiosaki, L. A. Wills, R. Hiskes, S. A. Dicarolis, and J. Amano, Appl. Phys. Lett. 68, 2358 (1996).
5. C. H. Ahn, T. Tybell, L. Antognazza, K. Char, R. H. Hammond, M. R. Beasley,. Fisher, and J.-M. Triscone, Science 276, 1100 (1997).
6. P. Paruch, T. Tybell, and J.-M. Triscone, Appl. Phys. Lett. 79, 530 (2001).
7. Y. Cho, K. Fujimoto, Y. Hiranaga, Y. Wagatsuma, A. Onoe, K. Terabe, and K. Kitamur, Nanotechnology 14, 637 (2003).
8. W. S. Ahn, W. W. Jung, S. K. Choi, and Y. Cho, Appl. Phys. Lett. 88, 082902 (2006).
9. A. Gruverman, H. Tokumoto, A. S. Prakash, S. Aggarwal, B. Yang, M. Wuttig, R. Ramesh, O. Auciello, and T. Venkatesan, Appl. Phys. Lett. 71, 3492 (1997).
10. D. Fu, K. Suzuki, K. Kato, M. Minakata, and H. Suzuki, Jpn. J. Appl. Phys., Part 1 41, 6724 (2002).
11. C. S. Ganpule, V. Nagarajan, S. B. Ogale, A. L. Roytburd, E. D. Williams, and R. Ramesh, Appl. Phys. Lett. 77, 3275 (2000).
12. C. S. Ganpule, A. L. Roytburd, V. Nagarajan, B. K. Hill, S. B. Ogale, E. D. Williams, R. Ramesh, and J. F. Scott, Phys. Rev. B 65, 014101 (2001).
13. S. Stemmer, S. K. Streiffer, F. Ernst, M. Rühle, W.-Y. Hsu, and R. Raj, Solid State Ionics 75, 43 (1995).
14. S. V. Kalinin and D. A. Bonnell, in Electric Scanning Probe Imaging and Modification of Ferroelectric Surfaces, in Nanoscale Characterization of Ferroelectric Materials, edited by, M. Alexe, and, A. Gruverman, (Springer, Berlin, 2004), pp. 1-39.
15. M. Molotskii, A. Agronin, P. Urenski, M. Shvebelman, G. Rosenman, and Y. Rosenwaks, Phys. Rev. Lett. 90, 107601 (2003).
16. J. Y. Son, K. Kyhm, and J. H. Cho, Appl. Phys. Lett. 89, 092907 (2006).
17. P. Meakin, Phys. Rep. 0370-1573 10.1016/0370-1573(93)90047-H 235, 1991 (1994); J. Krim and G. Palasantzas, Int. J. Mod. Phys. B 9, 599 (1995).
18. P. Meakin, Phys. Rep. 0370-1573 10.1016/0370-1573(93)90047-H 235, 1991 (1994); J. Krim and G. Palasantzas, Int. J. Mod. Phys. B 9, 599 (1995).
19. Y. P. Zhao, G. C. Wang, and T. M. Lu, in Characterization of Amorphous and Crystalline Rough Surface: Principles and Applications, edited by, R. Celotta, and, T. Lucatorto, (Academic, San Diego, 2001).
20. J. H. Haeni, P. Irvin, W. Chang, R. Uecker, P. Reiche, Y. L. Li, S. Choudhury, W. Tian, M. E. Hawley, B. Craigo, A. K. Tagantsev, X. Q. Pan, S. K. Streiffer, L. Q. Chen, S. W. Kirchoefer, J. Levy, and D. G. Schlom, Nature (London) 430, 758 (2004).
21. G. Shirane, S. Hoshino, and K. Suzuki, Phys. Rev. 80, 1105 (1950).