Scanning gate measurements on a coupled quantum dot - Quantum point contact system

AIP Conference Proceedings

Volumn 893, Issue , 2007, Pages 819-820

  Gildemeister, A E ^a   Ihn, T ^a   Schleser, R ^a   Ensslin, K ^a   Driscoll, D C ^b   Gossard, A C ^b  

^a ETH ZURICH   (Switzerland)

^b University of California   (United States)

Author keywords

Quantum dot; Quantum point contact; Scanning gate microscopy

Indexed keywords

EID: 77958470539     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2730142     Document Type: Conference Paper

References (10)

1. B.J. van Wees et al., Phys. Rev. Lett. 60, 848-850 (1988).
2. L. P. Kouwenhoven et al., Proceedings of the NATO Advanced Study Institute on Mesoscopic Electron Transport, Kluwer, 1997, pp. 105-214.
3. M. Field et al., Phys. Rev. Lett. 70, 1311-1314 (1993).
4. M. T. Woodside et al., Science 296, 1098-1101 (2002).
5. A. Pioda et al., Phys. Rev. Lett. 93, 216801 (2004).
6. P. Fallahi et al., Nano Lett. 5, 223-226 (2005).
7. R. Crook et al., Phys. Rev. B 66, 121301 (2002).
8. A. Pioda et al., cond-mat\0607161 (2006).
9. R. Held et al., Appl Phys. Lett. 71, 2689 (1997).
10. A. E. Gildemeister et al. (2006), manuscript in preparation.