Using atomic force microscopy to retrieve nanomechanical surface properties of materials

Materials Science Forum

Volumn 514-516, Issue PART 2, 2006, Pages 1598-1602

  Graca S ^a   Colaco R ^a   Vilar, R ^a  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

AFM; Nanoindentation; Nanoscratching

Indexed keywords

ATOMIC FORCE MICROSCOPY; GEOMETRY; MEASUREMENT ERRORS; OPTIMIZATION; SAPPHIRE; SURFACE PROPERTIES;

NANOMECHANICAL PROPERTY MEASUREMENTS; SURFACE VISUALIZATION;

NANOMECHANICS;

EID: 35549001166     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.514-516.1598     Document Type: Conference Paper

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