|
Volumn 154, Issue 12, 2007, Pages
|
Applicability of step-coverage modeling to TiO2thin films in atomic layer deposition
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ATOMIC LAYER DEPOSITION;
FILM THICKNESS;
NONLINEAR ANALYSIS;
PARAMETER ESTIMATION;
PROBABILITY;
THIN FILMS;
DEPOSITION TEMPERATURE;
MODEL PREDICTIONS;
NONLINEAR DEPENDENCE;
TITANIUM OXIDES;
|
EID: 35548962382
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.2789802 Document Type: Article |
Times cited : (30)
|
References (18)
|