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Volumn 154, Issue 12, 2007, Pages

Applicability of step-coverage modeling to TiO2thin films in atomic layer deposition

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LAYER DEPOSITION; FILM THICKNESS; NONLINEAR ANALYSIS; PARAMETER ESTIMATION; PROBABILITY; THIN FILMS;

EID: 35548962382     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2789802     Document Type: Article
Times cited : (30)

References (18)
  • 3
    • 0000836443 scopus 로고    scopus 로고
    • H. S.Nalwa, Editor, Vol. Academic Press, San Diego, CA
    • M. Ritala and M., Leskala, in Handbook of Thin Film Materials, H. S. Nalwa, Editor, Vol. 1, pp. 103-159, Academic Press, San Diego, CA (2002).
    • (2002) Handbook of Thin Film Materials , vol.1 , pp. 103-159
    • Ritala, M.1    Leskala, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.