SCOPUS 정보 검색 플랫폼

Volumn 154, Issue 12, 2007, Pages

Impact of particulate contaminants on the current leakage defect in OLED devices

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT LEAKAGE DEFECTS; FLAKED PARTICLES; LARGE PARTICLES; PARTICULATE CONTAMINANTS;

BUFFER LAYERS; ELECTRIC FIELDS; ELECTRON TUNNELING; IMPURITIES; LEAKAGE CURRENTS; SUBSTRATES;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 35548946594 PISSN: 00134651 EISSN: None Source Type: Journal
DOI: 10.1149/1.2784167 Document Type: Article

Times cited : (16)

References (15)

1
- 21544459113
- C. W. Tang and S. A. Van Slyke, Appl. Phys. Lett., 51, 913 (1987).
- (1987) Appl. Phys. Lett. , vol.51 , pp. 913
- Tang, C.W.¹ Van Slyke, S.A.²

2
- 9444296051
- J. R. Sheats, H. Antoniadis, M. Hueschen, W. Leonard, J. Miller, R. Moon, D. Roitman, and A. Stocking, Science, 273, 884 (1996).
- (1996) Science , vol.273 , pp. 884
- Sheats, J.R.¹ Antoniadis, H.² Hueschen, M.³ Leonard, W.⁴ Miller, J.⁵ Moon, R.⁶ Roitman, D.⁷ Stocking, A.⁸

3
- 0030411845
- J. L. Rothberg and A. J. Lovinger, J. Mater. Res., 11, 3174 (1996).
- (1996) J. Mater. Res. , vol.11 , pp. 3174
- Rothberg, J.L.¹ Lovinger, A.J.²

4
- 0001746946
- H. Aziz, Z. Popovic, C. P. Tripp, N. X. Hu, A. M. Hor, and G. Xu, Appl. Phys. Lett., 72, 2642 (1998).
- (1998) Appl. Phys. Lett. , vol.72 , pp. 2642
- Aziz, H.¹ Popovic, Z.² Tripp, C.P.³ Hu, N.X.⁴ Hor, A.M.⁵ Xu, G.⁶

5
- 0032677334
- T. P. Nguyen, M. Spiesser, A. Garnier, M. de Kok, and V. H. Tran, Mater. Sci. Eng., B, B60, 76 (1999).
- (1999) Mater. Sci. Eng., B , vol.60 , pp. 76
- Nguyen, T.P.¹ Spiesser, M.² Garnier, A.³ De Kok, M.⁴ Tran, V.H.⁵

6
- 0344613993
- N. E. Brese, C. L. Rohrer, and G. S. Rohrer, Solid State Ionics, 123, 19 (1999).
- (1999) Solid State Ionics , vol.123 , pp. 19
- Brese, N.E.¹ Rohrer, C.L.² Rohrer, G.S.³

7
- 0035336283
- P. E. Burrows, G. L. Graff, M. E. Gross, P. M. Martin, M. K. Shi, M. Hall, E. Mast, C. Bonham, W. Bennett, and M. B. Sullivan, Displays, 22, 65 (2001).
- (2001) Displays , vol.22 , pp. 65
- Burrows, P.E.¹ Graff, G.L.² Gross, M.E.³ Martin, P.M.⁴ Shi, M.K.⁵ Hall, M.⁶ Mast, E.⁷ Bonham, C.⁸ Bennett, W.⁹ Sullivan, M.B.¹⁰

8
- 0038608252
- K.-B. Kim, Y.-H. Tak, Y.-S. Han, K.-H. Baik, M.-H. Yoon, and M.-H. Lee, Jpn. J. Appl. Phys., Part 2, 42, L438 (2003).
- (2003) Jpn. J. Appl. Phys., Part 2 , vol.42 , pp. 438
- Kim, K.-B.¹ Tak, Y.-H.² Han, Y.-S.³ Baik, K.-H.⁴ Yoon, M.-H.⁵ Lee, M.-H.⁶

9
- 0037157426
- Y.-H. Tak, K.-B. Kim, H.-G. Park, K.-H. Lee, and J.-R. Lee, Thin Solid Films, 411, 12 (2002).
- (2002) Thin Solid Films , vol.411 , pp. 12
- Tak, Y.-H.¹ Kim, K.-B.² Park, H.-G.³ Lee, K.-H.⁴ Lee, J.-R.⁵

10
- 35548952936
- M. Schlott, M. Kutzner, B. L. Gehman, N. Reger, and F. J. Standermann, Tech. Dig. - Int. Electron Devices Meet., 1996, 522.
- Tech. Dig. - Int. Electron Devices Meet. , vol.1996 , pp. 522
- Schlott, M.¹ Kutzner, M.² Gehman, B.L.³ Reger, N.⁴ Standermann, F.J.⁵

11
- 33644760339
- T. Omata, M. Kita, H. Okada, S. O.-Y.-Matsuo, N. Ono, and H. Ikawa, Thin Solid Films, 503, 22 (2006).
- (2006) Thin Solid Films , vol.503 , pp. 22
- Omata, T.¹ Kita, M.² Okada, H.³ O.-Y.-Matsuo, S.⁴ Ono, N.⁵ Ikawa, H.⁶

12
- 36849097956
- M. Lenzlinger and E. H. Snow, J. Appl. Phys., 40, 278 (1969).
- (1969) J. Appl. Phys. , vol.40 , pp. 278
- Lenzlinger, M.¹ Snow, E.H.²

13
- 0031378784
- M. Hiramoto, H. Kumaoka, and M. Yokoyama, Synth. Met., 91, 77 (1997).
- (1997) Synth. Met. , vol.91 , pp. 77
- Hiramoto, M.¹ Kumaoka, H.² Yokoyama, M.³

14
- 35548944250
- H. Craig Miller, IEEE Trans. Electr. Insul., 24, 771 (1989).
- (1989) IEEE Trans. Electr. Insul. , vol.24 , pp. 771
- Craig Miller, H.¹

15
- 35548961647
- J. S. Brzosko, A. Konarzewski, A. Wojewodzka, E. Zukowski and J. Grudzinski, J. Phys. D, 8, L175 (1975).
- (1975) J. Phys. D , vol.8 , pp. 175
- Brzosko, J.S.¹ Konarzewski, A.² Wojewodzka, A.³ Zukowski, E.⁴ Grudzinski, J.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.